Application of total reflection X-ray fluorescence in semiconductor surface analysis

Determination of trace elements in rainwater by total-reflection x-ray fluorescence

Rolf Peter. Stoessel, Andreas Prange · Analytical Chemistry · 1985 · 104 citations

Natural Sciences, Chemistry, Earth Sciences +13

A highly sensitive energy-dispersive X-ray spectrometer with multiple total reflection of the exciting beam

H. Schwenke, J. Knoth · Nuclear Instruments and Methods in Physics Research · 1982 · 82 citations

Natural Sciences, Chemistry, Physics +15

Grazing incidence X-ray fluorescence analysis

Atsuo Iida, Kenji Sakurai, Atsushi Yoshinaga et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1986 · 66 citations

Natural Sciences, Chemistry, Spectroscopy +8

Total reflection X-ray fluorescence spectrometry for surface analysis

J. Knoth, H. Schwenke, U. Weisbrod · Spectrochimica Acta Part B Atomic Spectroscopy · 1989 · 44 citations

Natural Sciences, Chemistry, Materials Science +14

Degradation of metal-oxide-semiconductor devices caused by iron impurities on the silicon wafer surface

Ritsuo Takizawa, Toshiro Nakanishi, Akira Ohsawa · Journal of Applied Physics · 1987 · 42 citations

Engineering, Materials Engineering, Materials Science +17