Concepedia

Ritsuo Takizawa

RT

5

Publications

142

Citations

5

H-Index

1982

Active since

Affiliations

Fujitsu (Japan)(Current)

Ritsuo Takizawa is an author at Fujitsu (Japan) specializing in engineering, materials science, and nanoelectronics.

Top concepts

EngineeringMaterial ScienceApplied PhysicsNanoelectronicsSurface ScienceMicroelectronicsChemical EngineeringChemistryCorrosionElectrochemistry

Publications per year

1982–1988

5

Publications

5

Voltammetry at a trioctylphosphine oxide-coated glassy carbon electrode and its use for the determination of trace uranyl ions after preconcentration

Kosuke Izutsu, Toshio Nakamura, Ritsuo Takizawa et al. · Analytica Chimica Acta · 1983 · 45 citations

Materials Science, Engineering, Organic Electrochemistry +8

Degradation of metal-oxide-semiconductor devices caused by iron impurities on the silicon wafer surface

Ritsuo Takizawa, Toshiro Nakanishi, Akira Ohsawa · Journal of Applied Physics · 1987 · 42 citations

Engineering, Silicon On Insulator, Semiconductor Device +17

Influence of carbon and oxygen on donor formation at 700 °C in Czochralski-grown silicon

Akira Ohsawa, Ritsuo Takizawa, Kouichirou Honda et al. · Journal of Applied Physics · 1982 · 35 citations

Instrument measuring temperature dependence of minority-carrier lifetime without contact

Akira Ohsawa, Kouichirou Honda, Ritsuo Takizawa et al. · Review of Scientific Instruments · 1983 · 10 citations

Ultraclean Technique for Silicon Wafer Surfaces with HNO<sub>3</sub>-HF Systems

Ritsuo Takizawa, Toshiro Nakanishi, Kouichirou Honda et al. · Japanese Journal of Applied Physics · 1988 · 10 citations

Materials Science, Chemical Engineering, Wafer Scale Processing +13

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