Publication | Closed Access
Quantitative scanning capacitance microscopy analysis of two-dimensional dopant concentrations at nanoscale dimensions
39
Citations
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References
1996
Year
Materials ScienceNanoscale SystemEngineeringNanoscale DimensionsNanotechnologyScanning Probe MicroscopySurface ScienceApplied PhysicsTwo-dimensional Dopant ConcentrationsNanoscale ModelingNanometrologyNanoscale ScienceCapacitance Microscopy Analysis
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