Concepedia

Joseph J. Kopanski

JJ

Statistics

Publications

34

Citations

1.3K

H-Index

22

Active since

1984

Affiliations

National Institute of Standards and Technology(Current)

Case Western Reserve University

George Mason University

Intel (United States)

Kwangwoon University

Joseph J. Kopanski is an author at National Institute of Standards and Technology specializing in materials science, engineering, and electrical engineering.

ORCID

Publications per year

1984–2016

34

Publications

34

Influence of Metal–MoS<sub>2</sub>Interface on MoS<sub>2</sub>Transistor Performance: Comparison of Ag and Ti Contacts

Hui Yuan, Guangjun Cheng, Lin You et al. · ACS Applied Materials & Interfaces · 2014 · 114 citations

, , +17

Scanning capacitance microscopy measurements and modeling: Progress towards dopant profiling of silicon

Joseph J. Kopanski, J. F. Marchiando, Jeremiah R. Lowney · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 108 citations

, , +17

Calibrated nanoscale dopant profiling using a scanning microwave microscope

H. Huber, I. Humer, M. Hochleitner et al. · Journal of Applied Physics · 2012 · 90 citations

, , +17

Thermal oxidation of 3C silicon carbide single-crystal layers on silicon

C.D. Fung, Joseph J. Kopanski · Applied Physics Letters · 1984 · 85 citations

, , +17

Characterization of two-dimensional dopant profiles: Status and review

Alain C. Diebold, M.R. Kump, Joseph J. Kopanski et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 84 citations

, , +17

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