I. Humer is an author at TU Wien specializing in engineering, applied physics, and nanotechnology.
Top concepts
EngineeringApplied PhysicsPhysicsChemistryMicroscopyNanomaterialsNanoparticlesNanotechnologySemiconductorsInstrumentation
Publications per year
2011–2012
2
2
Calibrated nanoscale dopant profiling using a scanning microwave microscope
H. Huber, I. Humer, M. Hochleitner et al. · Journal of Applied Physics · 2012 · 90 citations
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