D. Adderton

High-speed tapping mode imaging with active <i>Q</i> control for atomic force microscopy

Todd Sulchek, Robert Hsieh, Jonathan D. Adams et al. · Applied Physics Letters · 2000 · 220 citations

Atomic Force Microscopy, Engineering, Microscopy +19

Noncontact nanolithography using the atomic force microscope

Kathryn Wilder, C. F. Quate, D. Adderton et al. · Applied Physics Letters · 1998 · 111 citations

Engineering, Microscopy, Mechanical Engineering +17

High-speed atomic force microscopy in liquid

Todd Sulchek, Robert Hsieh, Jonathan D. Adams et al. · Review of Scientific Instruments · 2000 · 101 citations

Biological Afm Observations, Engineering, Physics +14

Two-dimensional scanning capacitance microscopy measurements of cross-sectioned very large scale integration test structures

G. Neubauer, Andrew Erickson, C. C. Williams et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 81 citations

Engineering, Microscopy, Integrated Circuits +19

Dual integrated actuators for extended range high speed atomic force microscopy

Todd Sulchek, S. C. Minne, Jonathan D. Adams et al. · Applied Physics Letters · 1999 · 58 citations

Engineering, Microscopy, Mechanical Engineering +19