3D electro-thermal simulations of wide area power devices operating in avalanche condition

Michele Riccio, Gianluigi De Falco, Luca Maresca, Giovanni Breglio, Ettore Napoli, Andrea Irace, Yohei Iwahashi, P. Spirito

Microelectronics Reliability · 2012 · 17 citations · 12 references

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