Microelectronics Journal · 2011 · 16 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCmos Circuit DesignCurrent-voltage CharacteristicsDevice CharacterizationIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsTransistor BiasingBias Circuit DesignBias Temperature CompensationComplementary Metal-oxide-semiconductor BiasingStatistical Comparison Of Measurement ResultsTrimming
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Analysis and Design of Analog Integrated Circuits
W.R. Betts · Electronics and Power · 1978 · 3.8K citations
Modeling and analysis of manufacturing variations
Sani Nassif · 2002 · 432 citations