Dinesh Kumar Sharma

NBTI Degradation and Its Impact for Analog Circuit Reliability

Niraj K. Jha, P.S. Reddy, Dinesh Kumar Sharma et al. · IEEE Transactions on Electron Devices · 2005 · 107 citations

Reliability, Electrical Engineering, Reliability Engineering +13

Physical Insight Toward Heat Transport and an Improved Electrothermal Modeling Framework for FinFET Architectures

Mayank Shrivastava, Manish Agrawal, Sunny Mahajan et al. · IEEE Transactions on Electron Devices · 2012 · 105 citations

Engineering, Fin-shaped Field-effect Transistor, Thermal Failure +20

Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?

Angada B. Sachid, Roswald Francis, Maryam Shojaei Baghini et al. · 2008 · 76 citations

Electrical Engineering, High-kappa Spacers, Engineering +9

Toward System on Chip (SoC) Development Using FinFET Technology: Challenges, Solutions, Process Co-Development & Optimization Guidelines

Mayank Shrivastava, R. R. Mehta, Maryam Shojaei Baghini et al. · IEEE Transactions on Electron Devices · 2011 · 46 citations

Engineering, Vlsi Design, Electronic Design +19

A Novel Bottom Spacer FinFET Structure for Improved Short-Channel, Power-Delay, and Thermal Performance

Mayank Shrivastava, Maryam Shojaei Baghini, Dinesh Kumar Sharma et al. · IEEE Transactions on Electron Devices · 2010 · 46 citations

Device Modeling, Low-power Electronics, Electrical Engineering +11