Journal of Electronic Testing · 1998 · 10 citations · 8 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureLow-power DesignSystem-on-chip DesignConfigurable Logic BlocksLayout EvaluationLayout OptimizationLogic SynthesisMemory Hierarchy DesignTiming AnalysisFlip-flop ArchitectureFlip-flop DesignFlip-flopsPartial Scan DesignScan Chain Design
8
Designing circuits with partial scan
Vishwani D. Agrawal, Kwang‐Ting Cheng, David Johnson et al. · IEEE Design & Test of Computers · 1988 · 124 citations
Engineering, Computer Engineering, Electrical Engineering +10
Pascant: a partial scan and test generation system
Sudipta Bhawmik, Chih‐Jen Lin, Kwang‐Ting Cheng et al. · 2002 · 59 citations
J.–Y. Jou, Kwang‐Ting Cheng · 2002 · 43 citations