Concepedia

Voltage Drop Testing

Voltage Drop Testing is a diagnostic method used in electrical system analysis that measures the reduction in electrical potential across components or conductors under load to identify excessive resistance, poor connections, or circuit inefficiencies.

49

Publications

1.6K

Citations

196

Authors

78

Institutions

Publications per year

2017–2026

11

Parents

Publications

49

A Force Reproduction Analysis of Two Recording Sensors of a Computerized Occlusal Analysis System

Robert B. Kerstein, Mark E. Lowe, Mike Harty et al. · CRANIO® · 2006 · 116 citations

, , +13

A comparison of theoretical and experimental methods of calibrating the electrical potential drop technique for crack length determination

Michael Hicks, Andrew C Pickard · International Journal of Fracture · 1982 · 113 citations

, , +14

Support excitation scheme for transient analysis of JEDEC board-level drop test

Chang-Lin Yeh, Yi‐Shao Lai · Microelectronics Reliability · 2005 · 88 citations

, , +9

700-V asymmetrical 4H-SiC gate turn-off thyristors (GTO's)

Anant Agarwal, Jeff B. Casady, L.B. Rowland et al. · IEEE Electron Device Letters · 1997 · 79 citations

, , +14

Characterization of the electrosprays of 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl) imide in vacuum

Manuel Gamero-Castaño · Physics of Fluids · 2008 · 66 citations

, , +13

1–5 of 49

Authors

196

  1. JS
    Jie Sheng

    Shanghai Jiao Tong University, China

    2 publications · 39 citations

    2

    h-index

  2. MF
    Muhammad Faizan Shaikh

    Korea University, South Korea

    2 publications · 36 citations

    2

    h-index

  3. ZH
    Zhiyong Hong

    Shanghai Jiao Tong University, China

    2 publications · 39 citations

    2

    h-index

  4. RW
    R.T. Waters

    University of Wales, United Kingdom

    2 publications · 116 citations

    2

    h-index

  5. JZ
    J. Zhang

    Shanghai Jiao Tong University, China

    2 publications · 39 citations

    2

    h-index

1–5 of 196

Institutions

78

  1. Shanghai Jiao Tong University

    Shanghai, China

    2 h-index

    15 publications

    285 citations

  2. Korea University

    Seoul, South Korea

    2 h-index

    8 publications

    144 citations

  3. Imperial College London

    London, United Kingdom

    1 h-index

    2 publications

    70 citations

  4. Universidad Politécnica de Madrid

    Madrid, Spain

    1 h-index

    2 publications

    34 citations

  5. Sensors (United States)

    Los Gatos, United States

    1 h-index

    7 publications

    553 citations

  6. Delft University of Technology

    Delft, The Netherlands

    1 h-index

    2 publications

    34 citations

  7. American Electric Power (United States)

    Columbus, United States

    1 h-index

    2 publications

    66 citations

  8. State Key Joint Laboratory of Environment Simulation and Pollution Control

    Beijing, China

    1 h-index

    5 publications

    135 citations

1–8 of 78

Venues

  1. IEEE Transactions on Applied Superconductivity

    6 publications · 138 citations

    6

    h-index

  2. Microelectronics Reliability

    3 publications · 144 citations

    3

    h-index

  3. 2

    h-index

  4. IEEE Transactions on Energy Conversion

    2 publications · 36 citations

    2

    h-index

  5. Physics of Plasmas

    1 publications · 17 citations

    1

    h-index

1–5