Transient Susceptibility Testing

Transient Susceptibility Testing is a type of electromagnetic compatibility testing that evaluates a device's vulnerability to short-duration, high-amplitude electrical transients by assessing its performance degradation or malfunction under controlled transient stress conditions.

8

Publications

187

Citations

41

Authors

22

Institutions

Publications per year

2017–2026

1

Authors

41

  1. GH
    George H. Weiss

    National Institutes of Health, United States

    2 publications · 67 citations

    2

    h-index

  2. SW
    Steffen Wendsche

    Technische Universität Dresden, Germany

    1 publications · 10 citations

    1

    h-index

  3. NL
    Nicolas Lacrampe

    Centre National de la Recherche Scientifique, France

    1 publications · 18 citations

    1

    h-index

  4. HG
    Horst Gieser

    Fraunhofer Institute for Reliability and Microintegration, Germany

    1 publications · 25 citations

    1

    h-index

  5. CC
    C. Chatry

    Vanderbilt University, United States

    1 publications · 12 citations

    1

    h-index

1–5 of 41

Venues

  1. 4

    h-index

1–3