Transient Susceptibility Testing
Transient Susceptibility Testing is a type of electromagnetic compatibility testing that evaluates a device's vulnerability to short-duration, high-amplitude electrical transients by assessing its performance degradation or malfunction under controlled transient stress conditions.
8
Publications
187
Citations
41
Authors
22
Institutions
Publications per year
2017–2026
1
8
Investigation on ESD Transient Immunity of Integrated Circuits
Nicolas Lacrampe, Ali Alaeldine, Fabrice Caignet et al. · 2007 · 18 citations
Engineering, Computer Engineering, Electrical Engineering +17
1–5 of 8
41
2
h-index
1
h-index
1
h-index
Fraunhofer Institute for Reliability and Microintegration, Germany
1 publications · 25 citations
1
h-index
1
h-index
1–5 of 41
22
Accenture (Germany)
Düsseldorf, Germany
1 h-index
1 publications
10 citations

Leibniz University Hannover
Hanover, Germany
1 h-index
1 publications
53 citations
École Supérieure d'Électronique de l'Ouest
Angers, France
1 h-index
2 publications
36 citations
IBM (United States)
Armonk, United States
1 h-index
1 publications
25 citations

Université Fédérale de Toulouse Midi-Pyrénées
Toulouse, France
1 h-index
4 publications
72 citations
Förderverein Institut für Medizintechnik Dresden
Radebeul, Germany
1 h-index
1 publications
10 citations

Laboratoire d'Analyse et d'Architecture des Systèmes
Toulouse, France
1 h-index
4 publications
72 citations
Information Technology University
Lahore, Pakistan
1 h-index
1 publications
53 citations
1–8 of 22
4 publications · 90 citations
4
h-index
1 publications · 11 citations
1 publications · 11 citations
1–3