Template Metrology

Template Metrology is a specialized form of dimensional and pattern fidelity assessment within microfabrication metrology that quantitatively characterizes the geometric accuracy, feature placement, and surface integrity of master templates used in replication processes such as nanoimprint lithography.

6

Publications

210

Citations

42

Authors

13

Institutions

Publications per year

2017–2026

1

Authors

42

  1. JB
    Joost Bekaert

    IMEC, Belgium

    1 publications · 114 citations

    1

    h-index

  2. JS
    J. Seekamp

    University of Wuppertal, Germany

    1 publications · 13 citations

    1

    h-index

  3. IK
    Ioannis Karageorgos

    VIB-KU Leuven Center for Microbiology, Belgium

    1 publications · 114 citations

    1

    h-index

  4. JD
    Jan Doise

    IMEC, Belgium

    1 publications · 114 citations

    1

    h-index

  5. XY
    XiaoMin Yang

    Seagate (United States), United States

    1 publications · 27 citations

    1

    h-index

1–5 of 42

Venues

  1. Microelectronic Engineering

    1 publications · 13 citations

    1

    h-index

  2. Japanese Journal of Applied Physics

    JJAP · 1 publications · 19 citations

    1

    h-index

  3. 1

    h-index

  4. 1

    h-index

  5. IEEE Transactions on Magnetics

    1 publications · 27 citations

    1

    h-index

1–5