Template Metrology
Template Metrology is a specialized form of dimensional and pattern fidelity assessment within microfabrication metrology that quantitatively characterizes the geometric accuracy, feature placement, and surface integrity of master templates used in replication processes such as nanoimprint lithography.
6
Publications
210
Citations
42
Authors
13
Institutions
Publications per year
2017–2026
1
Parents
6
Advanced Lithography for Bit Patterned Media
XiaoMin Yang, Yuan Xu, Kim Lee et al. · IEEE Transactions on Magnetics · 2009 · 27 citations
HVM readiness of nanoimprint lithography templates: defects, CD, and overlay
Koji Ichimura, Kouji Yoshida, Saburo Harada et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 18 citations
Engineering, Manufacturing Engineering, Materials Science +16
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42
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13

Lund University
Lund, Sweden
1 h-index
6 publications
78 citations

University of Massachusetts Amherst
Amherst Center, United States
1 h-index
2 publications
40 citations
VIB-KU Leuven Center for Microbiology
Leuven, Belgium
1 h-index
2 publications
228 citations

University of Duisburg-Essen
Essen, Germany
1 h-index
2 publications
26 citations

VTT Technical Research Centre of Finland
Espoo, Finland
1 h-index
1 publications
13 citations
Hitachi (Japan)
Tokyo, Japan
1 h-index
1 publications
114 citations
Material (Belgium)
Brussels, Belgium
1 h-index
2 publications
228 citations
Seagate (United States)
Cupertino, United States
1 h-index
6 publications
162 citations
1–8 of 13
1 publications · 13 citations
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JJAP · 1 publications · 19 citations
1
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1 publications · 20 citations
1
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1 publications · 17 citations
1
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1 publications · 27 citations
1
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