A new flash E<sup>2</sup>PROM cell using triple polysilicon technology

F. Masuoka, Masafumi Asano, H. Iwahashi, +2

Non-volatile MemoryMiniaturizationEngineeringEmerging Memory TechnologyComputer Architecture +17

A robust recognition system for a drawing superimposed on a map

Shigeyoshi Shimotsuji, Osamu Hori, Masafumi Asano, +3

Computer

EngineeringRecognition SystemSketch-based ModelingShape AnalysisComputer-aided Design +19

A 256K flash EEPROM using triple polysilicon technology

F. Masuoka, Masafumi Asano, H. Iwahashi, +2

Hardware SecurityElectrical EngineeringChip SizeEngineeringSingle Transistor Cell +7

Design and Magnetic Field Measurement of the Superconducting Magnets for the Next-Generation Rotating Gantry

Shigeki Takayama, Takashi Yazawa, Masafumi Asano, +9

IEEE Transactions on Applied Superconductivity

Magnetic Field MeasurementEngineeringNext-generation Rotating GantryMagnetic SensorRotating Gantry +22

Form identification based on cell structure

Shigeyoshi Shimotsuji, Masafumi Asano

Cell StructureEngineeringStatistical Shape AnalysisBiometricsShape Analysis +17

4.5 kV novel high voltage high performance SiC-FET "SIAFET"

Y. Sugawara, Masafumi Asano, Ranbir Singh, +2

Electrical EngineeringEngineeringHigh Voltage EngineeringConductivity ModulationNanoelectronics +8

Fatigue Crack Growth Curve for Austenitic Stainless Steels in BWR Environment

Masao Itatani, Masafumi Asano, Mitsuru Kikuchi, +2

Journal of Pressure Vessel Technology

Conservative FcgrEngineeringCorrosionBwr EnvironmentMechanical Engineering +12

Metrology and inspection required for next generation lithography

Masafumi Asano, Ryoji Yoshikawa, Takashi Hirano, +7

Japanese Journal of Applied Physics

EngineeringElectron-beam LithographyMicroscopyEducationImage Placement Metrology +19

A 256-kbit flash E/SUP 2/PROM using triple-polysilicon technology

F. Masuoka, Masafumi Asano, H. Iwahashi, +3

IEEE Journal of Solid-State Circuits

Hardware SecurityNon-volatile MemoryElectrical EngineeringSingle TransistorEngineering +12

Impact of sampling on uncertainty: semiconductor dimensional metrology applications

Benjamin Bunday, Bart Rijpers, Bill Banke, +5

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

EngineeringMetrology SpecificationsMeasurementAccuracy And PrecisionEducation +18