F. Masuoka

Reliability issues of flash memory cells

S. Aritome, R. Shirota, Gertjan Hemink et al. · Proceedings of the IEEE · 1993 · 221 citations

Engineering, Computer Engineering, Electrical Engineering +15

New ultra high density EPROM and flash EEPROM with NAND structure cell

F. Masuoka, M. Momodom, Yoichi Iwata et al. · 1987 · 183 citations

Engineering, Computer Engineering, Electrical Engineering +14

Impact of surrounding gate transistor (SGT) for ultra-high-density LSI's

H. Takato, K. Sunouchi, N. Okabe et al. · IEEE Transactions on Electron Devices · 1991 · 145 citations

Engineering, Computer Engineering, Electrical Engineering +15

0.18-μm CMOS 10-Gb/s multiplexer/demultiplexer ICs using current mode logic with tolerance to threshold voltage fluctuation

A. Tanabe, M. Umetani, I. Fujiwara et al. · IEEE Journal of Solid-State Circuits · 2001 · 131 citations

Engineering, Computer Engineering, Electrical Engineering +17

A new flash E<sup>2</sup>PROM cell using triple polysilicon technology

F. Masuoka, Masafumi Asano, H. Iwahashi et al. · 1984 · 103 citations

Engineering, Computer Engineering, Electrical Engineering +13