Gertjan Hemink

Reliability issues of flash memory cells

S. Aritome, R. Shirota, Gertjan Hemink et al. · Proceedings of the IEEE · 1993 · 221 citations

Engineering, Computer Engineering, Electrical Engineering +15

Fast and accurate programming method for multi-level NAND EEPROMs

Gertjan Hemink, Tomoharu Tanaka, Tetsuo Endoh et al. · 2002 · 82 citations

Engineering, Computer Engineering, Electrical Engineering +8

A 56-nm CMOS 99-${\hbox {mm}}^{2} $ 8-Gb Multi-Level NAND Flash Memory With 10-MB/s Program Throughput

Ken Takeuchi, Yasushi Kameda, Susumu Fujimura et al. · IEEE Journal of Solid-State Circuits · 2007 · 70 citations

Engineering, Computer Engineering, Electrical Engineering +14

Stress-induced leakage current of tunnel oxide derived from flash memory read-disturb characteristics

S. Satoh, Gertjan Hemink, K. Hatakeyama et al. · IEEE Transactions on Electron Devices · 1998 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +15

Testability analysis of analog systems

Gertjan Hemink, B.W. Meijer, Hans G. Kerkhoff · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1990 · 59 citations · Full text

Engineering, Electrical Engineering, Analog Electronics +16