Scan Operations

Scan Operations is a reduction operation that computes a cumulative sequence of partial results by applying an associative binary operator across elements of an input array, preserving intermediate values at each step rather than returning only the final aggregate.

218

Publications

8.2K

Citations

563

Authors

220

Institutions

Publications per year

2017–2026

Variants

Prefix Scan

Parents

Reduction Operations

Publications

218

Active Storage for Large-Scale Data Mining and Multimedia

Erik Riedel, Garth A. Gibson, Christos Faloutsos · 1998 · 273 citations

Computing, Computer Science, Computer Systems +17

Effect of scan strategy on density and metallurgical properties of 17-4PH parts printed by Selective Laser Melting (SLM)

Rizwan Abdul Rahman Rashid, Syed H. Masood, Suresh Palanisamy et al. · Journal of Materials Processing Technology · 2017 · 237 citations · Full text

Engineering, Materials Engineering, Materials Science +15

Test volume and application time reduction through scan chain concealment

I. Bayraktaroglu, Alex Orailoğlu · 2001 · 222 citations

Computing, Computer Engineering, Computer Systems +10

Accuracy of different digital scanning techniques and scan bodies for complete-arch implant-supported prostheses

Ryan M. Mizumoto, Burak Yılmaz, Edwin A. McGlumphy et al. · Journal of Prosthetic Dentistry · 2019 · 210 citations

Dentistry, Prosthodontics, Surgery +14

Using a single input to support multiple scan chains

Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang · 1998 · 195 citations

Computing, Computer Engineering, Computer Science +10

1–5 of 218

Authors

563

SR
S.M. Reddy
University of Iowa, United States
12 publications · 359 citations
10
h-index
IP
Irith Pomeranz
University of Iowa, United States
11 publications · 281 citations
10
h-index
AC
Anshuman Chandra
Duke University, United States
6 publications · 325 citations
6
h-index
KK
Kewal K. Saluja
University of Wisconsin–Madison, United States
5 publications · 165 citations
5
h-index
KC
Krishnendu Chakrabarty
Duke University, United States
5 publications · 367 citations
5
h-index

1–5 of 563

Institutions

220

1–8 of 220

Venues

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
11 publications · 658 citations
10
h-index
IEEE Design & Test of Computers
4 publications · 126 citations
4
h-index
IEEE Transactions on Computers
3 publications · 142 citations
3
h-index
Journal of Electronic Testing
JETTA · 3 publications · 91 citations
3
h-index
ACM Transactions on Design Automation of Electronic Systems
TODAES · 2 publications · 31 citations
2
h-index

1–5