Kuen-Jong Lee

Using a single input to support multiple scan chains

Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang · 1998 · 195 citations

Computing, Computer Engineering, Computer Science +10

Broadcasting test patterns to multiple circuits

Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1999 · 66 citations

Engineering, Computer Engineering, Computer Science +13

Peak-power reduction for multiple-scan circuits during test application

Kuen-Jong Lee, T.Y. Haung, Jih-Jeen Chen · 2002 · 65 citations

Engineering, Computer Engineering, Electrical Engineering +13

Test Power Reduction with Multiple Capture Orders

Kuen-Jong Lee, Shaing-Jer Hsu, Chia-Ming Ho · 2005 · 57 citations

Engineering, Computer Engineering, Computer Science +17

A practical current sensing technique for I/sub DDQ/ testing

Jing-Jou Tang, Kuen-Jong Lee, Bin-Da Liu · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 1995 · 52 citations

Engineering, Electrical Engineering, Fault Tolerance +16