Concepedia

S-parameter Measurement

S-Parameter Measurement is a formal methodology in microwave network analysis that characterizes the linear behavior of electrical networks under steady-state conditions by quantifying the ratios of incident and reflected traveling wave amplitudes at each port of a multi-port device.

254

Publications

9.4K

Citations

757

Authors

256

Institutions

Publications per year

2017–2026

34

Parents

Publications

254

Measurement of Parity Nonconservation and an Anapole Moment in Cesium

C. S. Wood, S. C. Bennett, D. Cho et al. · Science · 1997 · 1.1K citations

, , +14

S-parameter-based IC interconnect transmission line characterization

W.R. Eisenstadt, Y. Eo · IEEE Transactions on Components Hybrids and Manufacturing Technology · 1992 · 627 citations

, , +16

MOS transistor modeling for RF IC design

Christian Enz, Yuhua Cheng · IEEE Journal of Solid-State Circuits · 2000 · 280 citations · Full text

, , +16

Improved three-step de-embedding method to accurately account for the influence of pad parasitics in silicon on-wafer RF test-structures

E.P. Vandamme, Dominique Schreurs, G. Van Dinther · IEEE Transactions on Electron Devices · 2001 · 256 citations

, , +16

Calibrating the Six-Port Reflectometer by Means of Sliding Terminations

Glenn F. Engen · IEEE Transactions on Microwave Theory and Techniques · 1978 · 219 citations

, , +12

1–5 of 254

Authors

757

  1. NR
    Nick Ridler

    National Physical Laboratory, United Kingdom

    10 publications · 331 citations

    10

    h-index

  2. MS
    Martin Salter

    National Physical Laboratory, United Kingdom

    7 publications · 262 citations

    7

    h-index

  3. DS
    Dominique Schreurs

    KU Leuven, Belgium

    6 publications · 436 citations

    6

    h-index

  4. FV
    Frans Verbeyst

    Vrije Universiteit Brussel, Belgium

    5 publications · 125 citations

    5

    h-index

  5. US
    U. Stumper

    Physikalisch-Technische Bundesanstalt, Germany

    5 publications · 162 citations

    5

    h-index

1–5 of 757

Institutions

256

  1. National Physical Laboratory

    London, United Kingdom

    10 h-index

    29 publications

    599 citations

  2. Korea Advanced Institute of Science and Technology

    Daejeon, South Korea

    7 h-index

    29 publications

    1K citations

  3. Physikalisch-Technische Bundesanstalt

    Braunschweig, Germany

    7 h-index

    11 publications

    310 citations

  4. Delft University of Technology

    Delft, The Netherlands

    6 h-index

    16 publications

    295 citations

  5. Hewlett-Packard (United States)

    Palo Alto, United States

    5 h-index

    5 publications

    160 citations

  6. University of Leeds

    Leeds, United Kingdom

    5 h-index

    8 publications

    116 citations

  7. National Institute of Astrophysics, Optics and Electronics

    Puebla City, Mexico

    5 h-index

    12 publications

    289 citations

  8. National Institute of Standards and Technology

    Gaithersburg, United States

    5 h-index

    15 publications

    509 citations

1–8 of 256

Venues

  1. 25

    h-index

  2. 11

    h-index

  3. IEEE Microwave Magazine

    6 publications · 281 citations

    6

    h-index

  4. Journal of Applied Physics

    6 publications · 229 citations

    6

    h-index

  5. IEEE Microwave and Guided Wave Letters

    5 publications · 119 citations

    5

    h-index

1–5