Return Path Discontinuities
Return Path Discontinuities is a signal integrity phenomenon characterized by abrupt changes or interruptions in the intended current return path along a reference plane, leading to impedance mismatches, increased electromagnetic radiation, and degraded signal performance in high-speed electronic circuits.
11
Publications
409
Citations
33
Authors
13
Institutions
Publications per year
2017–2026
0
Parents
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Georgia Institute of Technology
Atlanta, United States
4 h-index
11 publications
644 citations
Fraunhofer Institute for Reliability and Microintegration
Berlin, Germany
2 h-index
7 publications
73 citations

Ajou University
Suwon, South Korea
1 h-index
1 publications
14 citations
Massachusetts Institute of Technology
Cambridge, United States
1 h-index
4 publications
252 citations
Intel (United States)
Santa Clara, United States
1 h-index
1 publications
146 citations
Politecnico di Torino
Turin, Italy
1 h-index
1 publications
146 citations
Philips (United Kingdom)
Farnborough, United Kingdom
1 h-index
1 publications
10 citations

Iran University of Science and Technology
Tehran, Iran
1 h-index
3 publications
66 citations
1–8 of 13
3 publications · 208 citations
3
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1 publications · 14 citations
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PRL · 1 publications · 63 citations
1
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1 publications · 20 citations
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