Nano-metrology

Nano-Metrology is a branch of industrial metrology concerned with the measurement of physical properties and phenomena at the nanoscale, typically within the range of 1 to 100 nanometers, where quantum effects and surface interactions critically influence measurement accuracy and instrument design.

344

Publications

17.6K

Citations

1.3K

Authors

426

Institutions

Publications per year

2017–2026

71

Authors

1.3K

  1. EM
    Eberhard Manske

    Technische Universität Ilmenau, Germany

    11 publications · 555 citations

    11

    h-index

  2. LK
    Ludger Koenders

    Physikalisch-Technische Bundesanstalt, Germany

    8 publications · 352 citations

    8

    h-index

  3. HB
    Harald Bosse

    Physikalisch-Technische Bundesanstalt, Germany

    8 publications · 256 citations

    8

    h-index

  4. BB
    Benjamin Bunday

    National Institute of Standards and Technology, United States

    7 publications · 256 citations

    7

    h-index

  5. RA
    Ravikiran Attota

    National Institute of Standards and Technology, United States

    7 publications · 243 citations

    7

    h-index

1–5 of 1.3K

Venues

  1. Measurement Science and Technology

    28 publications · 1.2K citations

    22

    h-index

  2. 17

    h-index

  3. Metrologia

    10 publications · 303 citations

    10

    h-index

  4. Nanotechnology

    10 publications · 417 citations

    10

    h-index

  5. Optics Express

    9 publications · 180 citations

    9

    h-index

1–5