Harald Bosse

Measurement technologies for precision positioning

Wei Gao, Seung‐Woo Kim, Harald Bosse et al. · CIRP Annals · 2015 · 533 citations

Precision Measurement, Engineering, Location Estimation +8

Characterization of nanoparticles by scanning electron microscopy in transmission mode

Egbert Buhr, N Senftleben, Tobias Klein et al. · Measurement Science and Technology · 2009 · 123 citations

Nanoparticles, Engineering, Microscopy +17

Dimensional artefacts to achieve metrological traceability in advanced manufacturing

Simone Carmignato, Leonardo De Chiffre, Harald Bosse et al. · CIRP Annals · 2020 · 90 citations · Full text

Geometric Modeling, Industrial Design, Engineering +9

An electron optical metrology system for pattern placement measurements

Wolfgang Häßler‐Grohne, Harald Bosse · Measurement Science and Technology · 1998 · 68 citations

Engineering, Electron-beam Lithography, Microscopy +19

Heterodyne multi-wavelength absolute interferometry based on a cavity-enhanced electro-optic frequency comb pair

Ruitao Yang, Florian Pollinger, Karl Meiners-Hagen et al. · Optics Letters · 2014 · 67 citations

Optical Signatures, Frequency Metrology, Engineering +16