March Test Algorithms

March Test Algorithms is a systematic class of memory testing procedures distinguished by their specific sequence of read and write operations performed in ascending and descending address order to detect common fault models in semiconductor memory arrays.

119

Publications

4.1K

Citations

217

Authors

88

Institutions

Publications per year

2017–2026

7

Variants

March Tests

Authors

217

  1. AV
    A.J. van de Goor

    Delft University of Technology, Netherlands

    16 publications · 803 citations

    15

    h-index

  2. CW
    Cheng‐Wen Wu

    National Tsing Hua University, Taiwan

    13 publications · 880 citations

    12

    h-index

  3. PG
    Patrick Girard

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    8 publications · 286 citations

    8

    h-index

  4. AV
    A. Virazel

    Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France

    8 publications · 286 citations

    8

    h-index

  5. YZ
    Y. Zorian

    Cirrus Logic (United States), United States

    8 publications · 253 citations

    8

    h-index

1–5 of 217

Venues

  1. 11

    h-index

  2. IEEE Transactions on Computers

    8 publications · 675 citations

    8

    h-index

  3. 4

    h-index

  4. IET Computers & Digital Techniques

    3 publications · 50 citations

    3

    h-index

  5. Journal of Electronic Testing

    JETTA · 3 publications · 86 citations

    3

    h-index

1–5