March Test Algorithms
March Test Algorithms is a systematic class of memory testing procedures distinguished by their specific sequence of read and write operations performed in ascending and descending address order to detect common fault models in semiconductor memory arrays.
119
Publications
4.1K
Citations
217
Authors
88
Institutions
Publications per year
2017–2026
7
Variants
March Tests
Parents
119
March SS: a test for all static simple RAM faults
Said Hamdioui, A.J. van de Goor, M. Rodgers · 2003 · 134 citations
A programmable BIST core for embedded DRAM
Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu et al. · IEEE Design & Test of Computers · 1999 · 125 citations
1–5 of 119
217
15
h-index
12
h-index
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
8 publications · 286 citations
8
h-index
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier, France
8 publications · 286 citations
8
h-index
8
h-index
1–5 of 217
88

Delft University of Technology
Delft, The Netherlands
17 h-index
32 publications
1.6K citations
National Tsing Hua University
Hsinchu, Taiwan
12 h-index
50 publications
3.3K citations
Politecnico di Torino
Turin, Italy
10 h-index
42 publications
992 citations
Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Montpellier, France
9 h-index
34 publications
1.2K citations

Université de Montpellier
Montpellier, France
9 h-index
33 publications
1.2K citations

Belarusian State University of Informatics and Radioelectronics
Minsk, Belarus
7 h-index
13 publications
346 citations
National Central University
Taoyuan City, Taiwan
6 h-index
10 publications
281 citations
Infineon Technologies (Germany)
Munich, Germany
5 h-index
8 publications
405 citations
1–8 of 88
12 publications · 354 citations
11
h-index
8 publications · 675 citations
8
h-index
4 publications · 72 citations
4
h-index
3 publications · 50 citations
3
h-index
JETTA · 3 publications · 86 citations
3
h-index
1–5