Chih-Tsun Huang

Built-in redundancy analysis for memory yield improvement

Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li et al. · IEEE Transactions on Reliability · 2003 · 192 citations

Engineering, Mem Testing, Computer Architecture +17

A programmable BIST core for embedded DRAM

Chih-Tsun Huang, Jing-Reng Huang, Chi-Feng Wu et al. · IEEE Design & Test of Computers · 1999 · 124 citations

Programmable Bist Design, Engineering, Mem Testing +17

A high-throughput low-cost aes processor

Chih-Pin Su, Tsung-Fu Lin, Chih-Tsun Huang et al. · IEEE Communications Magazine · 2003 · 94 citations

Hardware Security, Data Encryption Standard, Engineering +15

RAMSES: a fast memory fault simulator

Chi-Feng Wu, Chih-Tsun Huang, Cheng‐Wen Wu · 2003 · 89 citations

Engineering, Mem Testing, Computer Architecture +17

March-based RAM diagnosis algorithms for stuck-at and coupling faults

Jin-Fu Li, Kuo-Liang Cheng, Chih-Tsun Huang et al. · 2002 · 69 citations

Fault Diagnosis, Diagnosis Complexity, Reliability Engineering +14