Flash Memory Reliability

Flash Memory Reliability is a metric that quantifies the durability and data retention accuracy of non-volatile flash memory in automotive microcontrollers under operational stress conditions such as temperature variation, voltage fluctuations, and write/erase cycling.

552

Publications

23.2K

Citations

Authors

335

Institutions

Publications per year

2017–2026

112

Parents

Automotive Microcontrollers

Publications

552

Introduction to flash memory

R. Bez, E. Camerlenghi, Alberto Modelli et al. · Proceedings of the IEEE · 2003 · 822 citations

Engineering, Computer Engineering, Electrical Engineering +17

NROM: A novel localized trapping, 2-bit nonvolatile memory cell

B. Eitan, Paolo Pavan, I. Bloom et al. · IEEE Electron Device Letters · 2000 · 547 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +12

Characterizing flash memory

Laura M. Grupp, Adrian M. Caulfield, Joel Coburn et al. · 2009 · 429 citations

Engineering, Computer Engineering, Computer Science +13

Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis

Yu Cai, Erich F. Haratsch, Onur Mutlu et al. · 2012 · 321 citations

Engineering, Computer Engineering, Computer Science +17

Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Yu Cai, Saugata Ghose, Erich F. Haratsch et al. · Proceedings of the IEEE · 2017 · 302 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 552

Authors

OM
Onur Mutlu
Carnegie Mellon University, United States
22 publications · 3.2K citations
22
h-index
EF
Erich F. Haratsch
Carnegie Mellon University, United States
20 publications · 2.7K citations
20
h-index
TK
Tei‐Wei Kuo
National Taiwan University, Taiwan
29 publications · 1.4K citations
18
h-index
YC
Yuan-Hao Chang
National Taiwan University, Taiwan
26 publications · 904 citations
17
h-index
AV
A. Visconti
University of Padua, Italy
20 publications · 1.3K citations
15
h-index

1–5 of 2K

Institutions

335

1–8 of 335

Venues

IEEE Transactions on Electron Devices
40 publications · 1.2K citations
21
h-index
IEEE Transactions on Nuclear Science
20 publications · 822 citations
18
h-index
IEEE Electron Device Letters
20 publications · 1.1K citations
16
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
12 publications · 272 citations
12
h-index
IEEE Transactions on Device and Materials Reliability
11 publications · 446 citations
10
h-index

1–5