Statistics
Publications
30
Citations
3K
H-Index
25
Active since
2001
Erich F. Haratsch is an author at Carnegie Mellon University specializing in computer engineering, engineering, and flash memory reliability.
Publications per year
2001–2018
30
30
Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis
Yu Cai, Erich F. Haratsch, Onur Mutlu et al. · 2012 · 321 citations
Data retention in MLC NAND flash memory: Characterization, optimization, and recovery
Yu Cai, Yixin Luo, Erich F. Haratsch et al. · 2015 · 266 citations · Full text
Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime
Yu Cai, Gülay Yalçın, Onur Mutlu et al. · 2012 · 241 citations · Full text
Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis and Modeling
Yu Cai, Erich F. Haratsch, Onur Mutlu et al. · Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 · 2013 · 227 citations
Engineering, Computer Engineering, Electrical Engineering +17
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