Yu Cai

Flash correct-and-refresh: Retention-aware error management for increased flash memory lifetime

Yu Cai, Gülay Yalçın, Onur Mutlu et al. · 2012 · 241 citations · Full text

Computing, Computer Engineering, Computer Science +16

Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis and Modeling

Yu Cai, Erich F. Haratsch, Onur Mutlu et al. · Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013 · 2013 · 227 citations

Engineering, Computer Engineering, Electrical Engineering +17

Program interference in MLC NAND flash memory: Characterization, modeling, and mitigation

Yu Cai, Onur Mutlu, Erich F. Haratsch et al. · 2013 · 207 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery

Yu Cai, Yixin Luo, Saugata Ghose et al. · 2015 · 204 citations · Full text

Engineering, Computer Engineering, Aging +13

Threshold Voltage Distribution in MLC NAND Flash Memory: Characterization, Analysis, and Modeling

Yu Cai, Erich F. Haratsch, Onur Mutlu et al. · 2013 · 187 citations

Engineering, Computer Engineering, Electrical Engineering +17