Erase Cycling

Erase Cycling is a fundamental wear mechanism in solid-state storage characterized by the repeated process of erasing data from a block of non-volatile memory cells, which progressively degrades the oxide layers within the cells and limits the block's usable lifespan.

125

Publications

5.1K

Citations

576

Authors

140

Institutions

Publications per year

2017–2026

13

Authors

576

  1. NM
    Neal Mielke

    Intel (United States), United States

    5 publications · 783 citations

    5

    h-index

  2. JV
    Jan Van Houdt

    IMEC, Belgium

    5 publications · 120 citations

    5

    h-index

  3. JG
    Jan Genoe

    IMEC, Belgium

    4 publications · 117 citations

    4

    h-index

  4. PH
    Paul Heremans

    IMEC, Belgium

    4 publications · 117 citations

    4

    h-index

  5. AV
    A. Visconti

    University of Padua, Italy

    3 publications · 50 citations

    3

    h-index

1–5 of 576

Venues

  1. IEEE Transactions on Electron Devices

    12 publications · 320 citations

    12

    h-index

  2. IEEE Electron Device Letters

    14 publications · 347 citations

    11

    h-index

  3. Applied Physics Letters

    10 publications · 724 citations

    10

    h-index

  4. Japanese Journal of Applied Physics

    JJAP · 7 publications · 197 citations

    7

    h-index

  5. 3

    h-index

1–5