Electromigration Checking

Electromigration Checking is a design rule checking method that verifies the current-carrying capacity of interconnects in integrated circuits to prevent material migration due to high current density over time.

Publications

529

Citations

Authors

Institutions

Publications per year

2017–2026

Parents

Design Rule Checking

Publications

Power Grid Electromigration Checking Using Physics-Based Models

Sandeep Chatterjee, Valeriy Sukharev, Farid N. Najm · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2017 · 106 citations

Engineering, Computer Engineering, Electrical Engineering +15

EMSpice: Physics-Based Electromigration Check Using Coupled Electronic and Stress Simulation

Zeyu Sun, Shuyuan Yu, Han Zhou et al. · IEEE Transactions on Device and Materials Reliability · 2020 · 40 citations

Engineering, Computer Engineering, Electrical Engineering +17

Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires

Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Voltage-based electromigration immortality check for general multi-branch interconnects

Zeyu Sun, Ertugrul Demircan, Mehul D. Shrof et al. · 2016 · 38 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Electromigration Check: Where the Design and Reliability Methodologies Meet

Valeriy Sukharev, Farid N. Najm · IEEE Transactions on Device and Materials Reliability · 2018 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +17

1–5 of 21

Authors

SX
Sheldon X.-D. Tan
University of California, Riverside, United States
7 publications · 165 citations
7
h-index
ZS
Zeyu Sun
University of California, Riverside, United States
7 publications · 165 citations
7
h-index
FN
Farid N. Najm
University of Toronto, Canada
6 publications · 242 citations
6
h-index
SC
Sandeep Chatterjee
University of Toronto, Canada
5 publications · 208 citations
5
h-index
VS
Valeriy Sukharev
Mentor Technologies, United States
4 publications · 185 citations
4
h-index

1–5 of 46

Institutions

1–8 of 17

Venues

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)
Conference · 2 publications · 21 citations
2
h-index
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2 publications · 146 citations
2
h-index
IEEE Transactions on Device and Materials Reliability
2 publications · 74 citations
2
h-index
MRS Proceedings
1 publications · 11 citations
1
h-index
Journal of Electrostatics
1 publications · 10 citations
1
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1–5