Ertugrul Demircan

A de-embedding technique for interconnects

Jiming Song, Feng Ling, G. Flynn et al. · 2002 · 99 citations

Electrical Engineering, Engineering, Interconnect (Integrated Circuits) +13

Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method

Chase Cook, Zeyu Sun, Ertugrul Demircan et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2018 · 52 citations

Numerical Analysis, Engineering, Computational Mechanics +17

Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires

Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2018 · 38 citations

Electrical Engineering, Electromigration Technique, Engineering +11

Voltage-based electromigration immortality check for general multi-branch interconnects

Zeyu Sun, Ertugrul Demircan, Mehul D. Shrof et al. · 2016 · 37 citations · Full text

Engineering, Current Density, Power Electronics +16

Modeling of MOSFET parasitic capacitances, and their impact on circuit performance

J. Mueller, R. Thomä, Ertugrul Demircan et al. · Solid-State Electronics · 2007 · 31 citations

Device Modeling, Electrical Engineering, Physical Design (Electronics) +9