Concepedia

Author

Valeriy Sukharev

Mentor TechnologiesORCID

Also Known As

V M Sukharev, V. Sukharev, V. Ya. Sukharev, V.M. Sukharev, V.Ya. Sukharev, Valeriy Sukharev, Valery Ya. Sukharev

137

Publications

1.8K

Citations

22

H-Index

92

Concepts

All Affiliations

Mentor TechnologiesUniversity of California, RiversideUniversity of TorontoSiemens (United States)Shanghai Jiao Tong University
VS

About

Valeriy Sukharev is an author at Mentor Technologies specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

22

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2

Applied Physics

14

19

677

3

Chemical Engineering

3

3

77

4

Chemistry

2

2

67

5

Health Sciences

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57

Valeriy Sukharev

×

45

Publications

1.5K

Citations

22

H-Index

YearCitations

Physics-based Electromigration Assessment for Power Grid Networks

Xin Huang, Tan Yu, Valeriy Sukharev,

2014

124

Microtrenching resulting from specular reflection during chlorine etching of silicon

Robert J. Hoekstra, Mark J. Kushner, Valeriy Sukharev,

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

1998

107

Power Grid Electromigration Checking Using Physics-Based Models

Sandeep Chatterjee, Valeriy Sukharev, Farid N. Najm

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

2017

101

A model for electromigration-induced degradation mechanisms in dual-inlaid copper interconnects: Effect of microstructure

Valeriy Sukharev, Ehrenfried Zschech, William D. Nix

Journal of Applied Physics

2007

90

Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks

Xin Huang, Armen Kteyan, Sheldon X.-D. Tan,

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

2016

87

A model for electromigration-induced degradation mechanisms in dual-inlaid copper interconnects: Effect of interface bonding strength

Valeriy Sukharev, Ehrenfried Zschech

Journal of Applied Physics

2004

81

Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees

Hai‐Bao Chen, Sheldon X.-D. Tan, Xin Huang,

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

2016

70

Beyond Black’s equation: Full-chip EM/SM assessment in 3D IC stack

Valeriy Sukharev

Microelectronic Engineering

2013

62

Postvoiding Stress Evolution in Confined Metal Lines

Valeriy Sukharev, Armen Kteyan, Xin Huang

IEEE Transactions on Device and Materials Reliability

2015

61

Concerning the role of oxygen in photocatalytic decomposition of salicylic acid in water

Valeriy Sukharev, Robert Kershaw

Journal of Photochemistry and Photobiology A Chemistry

1996

57

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