Concepedia

Device Noise Reliability

Device Noise Reliability is a metric that quantifies the consistency and stability of electronic device performance under the influence of inherent noise sources over time and varying operational conditions.

17

Publications

284

Citations

74

Authors

37

Institutions

Publications per year

2017–2026

3

Parents

Publications

17

1/f noise as a reliability estimation for solar cells

L.K.J. Vandamme, R. Alabédra, M. Zommiti · Solid-State Electronics · 1983 · 52 citations

, , +14

Printable Epsilon‐Type Structure Transistor Arrays with Highly Reliable Physical Unclonable Functions

Rui Wang, Kun Liang, Saisai Wang et al. · Advanced Materials · 2023 · 26 citations

, , +17

Reliability investigation of light-emitting diodes via low frequency noise characteristics

Sandra Pralgauskaitė, Vilius Palenskis, Jonas Matukas et al. · Microelectronics Reliability · 2014 · 19 citations

, , +16

AlGaN/GaN HEMT Reliability Assessment by means of Low Frequency Noise Measurements

A. Sozza, Arnaud Curutchet, C. Dua et al. · Microelectronics Reliability · 2006 · 16 citations

, , +13

Low-Noise Bias Reliability of AlInAs/GaInAs Modulation-Doped Field Effect Transistors with Linearly Graded Low-Temperature Buffer Layers Grown on GaAs Substrates

A. S. Wakita, Hans Rohdin, V. M. Robbins et al. · Japanese Journal of Applied Physics · 1999 · 16 citations

, , +17

1–5 of 17

Authors

74

  1. AS
    A. S. Wakita

    Hewlett-Packard (United States), United States

    2 publications · 30 citations

    2

    h-index

  2. DP
    David P. Basile

    Indiana University – Purdue University Indianapolis, United States

    2 publications · 30 citations

    2

    h-index

  3. NM
    N. Moll

    Hewlett-Packard (United States), United States

    2 publications · 30 citations

    2

    h-index

  4. VM
    V. M. Robbins

    Hewlett-Packard (United States), United States

    2 publications · 30 citations

    2

    h-index

  5. LV
    L.K.J. Vandamme

    Eindhoven University of Technology, Netherlands

    2 publications · 67 citations

    2

    h-index

1–5 of 74

Institutions

37

  1. Xidian University

    Xi'an, China

    2 h-index

    10 publications

    228 citations

  2. Hewlett-Packard (United States)

    Palo Alto, United States

    2 h-index

    14 publications

    210 citations

  3. Thales (France)

    Paris, France

    2 h-index

    3 publications

    43 citations

  4. Institut d'électronique de microélectronique et de nanotechnologie

    Villeneuve-d'Ascq, France

    2 h-index

    2 publications

    27 citations

  5. Westlake University

    Hangzhou, China

    1 h-index

    2 publications

    52 citations

  6. Broadcom (Israel)

    Raanana, Israel

    1 h-index

    5 publications

    75 citations

  7. Newport Chemical Depot

    Clinton, United States

    1 h-index

    1 publications

    10 citations

  8. Eindhoven University of Technology

    Eindhoven, The Netherlands

    1 h-index

    3 publications

    45 citations

1–8 of 37

Venues

  1. Microelectronics Reliability

    4 publications · 58 citations

    4

    h-index

  2. Solid-State Electronics

    2 publications · 67 citations

    2

    h-index

  3. Electronics Letters

    1 publications · 12 citations

    1

    h-index

  4. IEEE Journal of Solid-State Circuits

    1 publications · 15 citations

    1

    h-index

  5. IEEE Sensors Journal

    1 publications · 11 citations

    1

    h-index

1–5