Concepedia

C. Hu

CH

34

Publications

1.8K

Citations

18

H-Index

1978

Active since

Affiliations

University of California, Berkeley(Current)

Semiconductor Manufacturing International (Italy)

Hodges University

Intel (United States)

NEC (Japan)

C. Hu is an author at University of California, Berkeley specializing in microelectronics, engineering, and electrical engineering.

Top concepts

EngineeringMicroelectronicsElectrical EngineeringApplied PhysicsDevice ModelingComputer EngineeringIntegrated CircuitsPhysicsElectronic EngineeringPower Electronics

Publications per year

1978–2023

34

Publications

34

The impact of gate-induced drain leakage current on MOSFET scaling

T.Y. Chan, J. Chen, P.K. Ko et al. · 1987 · 344 citations

Device Modeling, Electrical Engineering, Engineering +11

Future CMOS scaling and reliability

C. Hu · Proceedings of the IEEE · 1993 · 207 citations

Mosfet Device Dimensions, Engineering, Computer Architecture +16

Substrate hole current and oxide breakdown

I. C. Chen, S. Holland, K.K. Young et al. · Applied Physics Letters · 1986 · 202 citations

Hole Fluence, Electrical Engineering, Hot-hole Tunneling +11

Electron-trap generation by recombination of electrons and holes in SiO2

I. C. Chen, S. Holland, C. Hu · Journal of Applied Physics · 1987 · 138 citations

Semiconductors, Engineering, Physics +13

Ultra-thin silicon dioxide leakage current and scaling limit

K.F. Schuegraf, C.-C. King, C. Hu · 2003 · 119 citations

Semiconductors, Electrical Engineering, Engineering +14

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