Concepedia

Author

K.F. Schuegraf

University of California, Berkeley

Also Known As

K F Schuegraf, K. F. Schuegraf, K. Schuegraf, K.F. Schuegraf, Klaus F. Schuegraf, Klein, S.

14

Publications

1.2K

Citations

9

H-Index

18

Concepts

All Affiliations

University of California, Berkeley
KS

About

K.F. Schuegraf is an author at University of California, Berkeley specializing in electrical engineering, applied physics, and engineering.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

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9

1.2K

2

Applied Physics

9

9

1.2K

3

Electrical Engineering

9

9

1.2K

4

Materials Science

1

1

33

5

Physics

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119

K.F. Schuegraf

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9

Publications

1.2K

Citations

9

H-Index

YearCitations

Hole injection SiO/sub 2/ breakdown model for very low voltage lifetime extrapolation

K.F. Schuegraf, Chenming Hu

IEEE Transactions on Electron Devices

1994

538

Metal-oxide-semiconductor field-effect-transistor substrate current during Fowler–Nordheim tunneling stress and silicon dioxide reliability

K.F. Schuegraf, Chenming Hu

Journal of Applied Physics

1994

136

Reliability of thin SiO<sub>2</sub>

K.F. Schuegraf, Chenming Hu

Semiconductor Science and Technology

1994

131

Ultra-thin silicon dioxide leakage current and scaling limit

K.F. Schuegraf, C.-C. King, C. Hu

2003

119

Hole injection oxide breakdown model for very low voltage lifetime extrapolation

K.F. Schuegraf, Chenming Hu

1993

81

Effects of temperature and defects on breakdown lifetime of thin SiO/sub 2/ at very low voltages

K.F. Schuegraf, Chenming Hu

IEEE Transactions on Electron Devices

1994

75

Impact of polysilicon depletion in thin oxide MOS technology

K.F. Schuegraf, C.-C. King, Chenming Hu

2002

33

Effects of temperature and defects on breakdown lifetime of thin SiO/sub 2/ at very low voltages

K.F. Schuegraf, Chenming Hu

1994

25

Reliability of thin SiO/sub 2/ at direct-tunneling voltages

K.F. Schuegraf, Donggun Park, Chenming Hu

2002

22

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