Xiaowei Deng

Impact of Low-Energy Proton Induced Upsets on Test Methods and Rate Predictions

Brian D. Sierawski, Jonathan A. Pellish, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2009 · 194 citations

Engineering, Computer Engineering, Electrical Engineering +14

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Alan D. Tipton, Jonathan A. Pellish, John M. Hutson et al. · IEEE Transactions on Nuclear Science · 2008 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +14

Characterization of bit transistors in a functional SRAM

Xiaowei Deng, Wah Kit Loh, Beena Pious et al. · 2008 · 20 citations

Engineering, Computer Engineering, Electrical Engineering +14

A Quantitative Assessment of Charge Collection Efficiency of N+ and P+ Diffusion Areas in Terrestrial Neutron Environment

Xiao‐Wei Zhu, Xiaowei Deng, R. Baumann et al. · IEEE Transactions on Nuclear Science · 2007 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +15

Heavy Ion Testing With Iron at 1 GeV/amu

Jonathan A. Pellish, M.A. Xapsos, Kenneth A. LaBel et al. · IEEE Transactions on Nuclear Science · 2010 · 11 citations

Engineering, Aerospace Engineering, Computer Engineering +15