Keum Hwan Noh

Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories

Changbeom Woo, Myeongwon Lee, Shin-Keun Kim et al. · 2019 · 31 citations

Engineering, Charge Transport, Charge Loss Mechanisms +16

Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories

Changbeom Woo, Shin-Keun Kim, Jaeyeol Park et al. · 2020 · 27 citations

Non-volatile Memory, Engineering, Charge Failure Mechanisms +17

Separation of Lateral Migration Components by Hole During the Short-Term Retention Operation in 3-D NAND Flash Memories

Shin-Keun Kim, Haesoo Kim, Changbeom Woo et al. · IEEE Transactions on Electron Devices · 2020 · 16 citations

Engineering, Charge Transport, Photovoltaics +22

Abnormal Disturbance Mechanism of Sub-100 nm NAND Flash Memory

Seok Jin Joo, Hea Jong Yang, Keum Hwan Noh et al. · Japanese Journal of Applied Physics · 2006 · 14 citations

Non-volatile Memory, Electrical Engineering, Engineering +12

A highly manufacturable integration technology of 20nm generation 64Gb multi-level NAND flash memory

Keun Woo Lee, Se Kyoung Choi, Sung Jae Chung et al. · 2011 · 13 citations

Non-volatile Memory, Electrical Engineering, Engineering +15