Jaeyeol Park

Modeling of Charge Loss Mechanisms during the Short Term Retention Operation in 3-D NAND Flash Memories

Changbeom Woo, Myeongwon Lee, Shin-Keun Kim et al. · 2019 · 31 citations

Engineering, Charge Transport, Charge Loss Mechanisms +16

Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories

Changbeom Woo, Shin-Keun Kim, Jaeyeol Park et al. · 2020 · 27 citations

Non-volatile Memory, Engineering, Charge Failure Mechanisms +17

Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory

Dokyun Son, Jaeyeol Park, Hyungcheol Shin · IEEE Transactions on Electron Devices · 2020 · 22 citations

Non-volatile Memory, Electrical Engineering, Read Disturbance +13

Modeling of Lateral Migration Mechanism During the Retention Operation in 3D NAND Flash Memories

Changbeom Woo, Shin-Keun Kim, Jaeyeol Park et al. · 2019 Electron Devices Technology and Manufacturing Conference (EDTM) · 2019 · 19 citations

Electrical Engineering, Electronic Devices, Storage Systems +15

Strain Engineering for 3.5-nm Node in Stacked-Nanoplate FET

Hyunsuk Kim, Dokyun Son, Ilho Myeong et al. · IEEE Transactions on Electron Devices · 2019 · 12 citations

Engineering, Mechanical Engineering, Material Simulation +20