T. Kunio

A 30-ns 64-Mb DRAM with built-in self-test and self-repair function

A. Tanabe, T. Takeshima, Hiroki Koike et al. · IEEE Journal of Solid-State Circuits · 1992 · 79 citations

Engineering, Emerging Memory Technology, Mem Testing +16

NV-SRAM: a nonvolatile SRAM with backup ferroelectric capacitors

T. Miwa, J. Yamada, Hiroki Koike et al. · IEEE Journal of Solid-State Circuits · 2001 · 63 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +11

Three dimensional ICs, having four stacked active device layers

T. Kunio, K. Oyama, Y. Hayashi et al. · 2003 · 55 citations

Engineering, Four-layer-stacked Master Slice, Integrated Circuits +19

A dual-metal gate CMOS technology using nitrogen-concentration-controlled TiNx film

Hitoshi Wakabayashi, Y. Saito, Kiyoshi Takeuchi et al. · IEEE Transactions on Electron Devices · 2001 · 54 citations

Materials Science, Electrical Engineering, Engineering +9

An effective channel length determination method for LDD MOSFETs

Kiyoshi Takeuchi, N. Kasai, T. Kunio et al. · IEEE Transactions on Electron Devices · 1996 · 46 citations

Device Modeling, Channel Length, Electrical Engineering +11