Tahui Wang

Cause of data retention loss in a nitride-based localized trapping storage flash memory cell

Wen-Jer Tsai, S.H. Gu, N. K. Zous et al. · 2003 · 41 citations

Retention Loss, Electrical Engineering, Data Retention Loss +13

Profiling of Nitride-Trap-Energy Distribution in SONOS Flash Memory by Using a Variable-Amplitude Low-Frequency Charge-Pumping Technique

Yi-Ying Liao, Sheng-Fu Horng, Yao-Wen Chang et al. · IEEE Electron Device Letters · 2007 · 15 citations

Sonos Flash Memory, Electrical Engineering, Non-volatile Memory +13

A new technique to extract oxide trap time constants in MOSFET's

Tahui Wang, Ting-Wei Chang, L.P. Chiang et al. · IEEE Electron Device Letters · 1996 · 13 citations

Hot Electron Stress, Electrical Engineering, New Technique +6

An endurance evaluation method for flash EEPROM

N. K. Zous, Yin-Jen Chen, Chi-Yuan Chin et al. · IEEE Transactions on Electron Devices · 2004 · 10 citations

Non-volatile Memory, Electrical Engineering, Reliability Engineering +12