L.P. Chiang

Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique

T. Wang, Ting-Wei Chang, L.P. Chiang et al. · IEEE Transactions on Electron Devices · 1998 · 60 citations

Device Modeling, Electrical Engineering, Engineering +10

Structural effect on band-trap-band tunneling induced drain leakage in n-MOSFET's

Tahui Wang, Ting-Wei Chang, C.M. Huang et al. · IEEE Electron Device Letters · 1995 · 17 citations

Device Modeling, Electrical Engineering, Structural Dependence +11

A new technique to extract oxide trap time constants in MOSFET's

Tahui Wang, Ting-Wei Chang, L.P. Chiang et al. · IEEE Electron Device Letters · 1996 · 13 citations

Hot Electron Stress, Electrical Engineering, New Technique +6

Valence-band tunneling enhanced hot carrier degradation in ultrathin oxide nMOSFETs

Chin-Hung Tsai, Siyuan Gu, L.P. Chiang et al. · 2002 · 13 citations

Materials Engineering, Semiconductor Technology, Electrical Engineering +12