N. K. Zous

Data retention behavior of a SONOS type two-bit storage flash memory cell

Wen-Jer Tsai, N. K. Zous, C.J. Liu et al. · 2002 · 91 citations

Non-volatile Memory, Electrical Engineering, Data Retention Loss +15

Investigation of oxide charge trapping and detrapping in a MOSFET by using a GIDL current technique

T. Wang, Ting-Wei Chang, L.P. Chiang et al. · IEEE Transactions on Electron Devices · 1998 · 60 citations

Device Modeling, Electrical Engineering, Engineering +10

A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFETs

Tahui Wang, Lu-Ping Chiang, N. K. Zous et al. · IEEE Transactions on Electron Devices · 1999 · 44 citations

Comprehensive Study, Electrical Engineering, Engineering +12

Cause of data retention loss in a nitride-based localized trapping storage flash memory cell

Wen-Jer Tsai, S.H. Gu, N. K. Zous et al. · 2003 · 41 citations

Retention Loss, Electrical Engineering, Data Retention Loss +13

Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells

T. Wang, Wen-Jer Tsai, S.H. Gu et al. · 2004 · 41 citations

Reliability Models, Non-volatile Memory, Engineering +17