T. Wang

Cold CMOS as a Power-Performance-Reliability Booster for Advanced FinFETs

Hung-Li Chiang, Tao Chen, J. F. Wang et al. · 2020 · 69 citations

Low-power Electronics, Electrical Engineering, Engineering +10

Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells

T. Wang, Wen-Jer Tsai, S.H. Gu et al. · 2004 · 41 citations

Reliability Models, Non-volatile Memory, Engineering +17

Physics and Characterization of Various Hot-Carrier Degradation Modes in LDMOS by Using a Three-Region Charge-Pumping Technique

Chih‐Chia Cheng, Jing-Wei Lin, T. Wang et al. · IEEE Transactions on Device and Materials Reliability · 2006 · 34 citations

Semiconductor Technology, Electrical Engineering, Engineering +9

Subnanosecond flash memory enabled by 2D-enhanced hot-carrier injection

Yutong Xiang, Chong Wang, Chunsen Liu et al. · Nature · 2025 · 21 citations · Full text

Positive Oxide Charge-Enhanced Read Disturb in a Localized Trapping Storage Flash Memory Cell

Wen-Jer Tsai, Chi‐Ju Yeh, N. K. Zous et al. · IEEE Transactions on Electron Devices · 2004 · 18 citations

Non-volatile Memory, Electrical Engineering, Engineering +13