Wen-Jer Tsai

Data retention behavior of a SONOS type two-bit storage flash memory cell

Wen-Jer Tsai, N. K. Zous, C.J. Liu et al. · 2002 · 91 citations

Engineering, Electrical Engineering, Materials Science +15

Cause of data retention loss in a nitride-based localized trapping storage flash memory cell

Wen-Jer Tsai, S.H. Gu, N. K. Zous et al. · 2003 · 41 citations

Engineering, Electrical Engineering, Materials Science +16

Reliability models of data retention and read-disturb in 2-bit nitride storage flash memory cells

T. Wang, Wen-Jer Tsai, S.H. Gu et al. · 2004 · 41 citations

Engineering, Computer Engineering, Electrical Engineering +15

Polycrystalline-silicon channel trap induced transient read instability in a 3D NAND flash cell string

Wen-Jer Tsai, Wei-Liang Lin, C. C. Cheng et al. · 2016 · 36 citations

Engineering, Computer Engineering, Electrical Engineering +15

Electric Field Induced Nitride Trapped Charge Lateral Migration in a SONOS Flash Memory

Yuheng Liu, Cheng-Min Jiang, Wei‐Chun Chen et al. · IEEE Electron Device Letters · 2016 · 30 citations

Engineering, Electrical Engineering, Materials Science +15