Shinsuke Sadamitsu - Concepedia

Author

Shinsuke Sadamitsu

Sumco Corporation (Japan)

Also Known As

S. Sadamitsu, Shinsuke Sadamitsu

Publications

476

Citations

H-Index

Concepts

All Affiliations

Sumco Corporation (Japan)Sumitomo Electric Industries (Japan)

About

Shinsuke Sadamitsu is an author at Sumco Corporation (Japan) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	14	446
2	Applied Physics	14	14	446
3	Materials Engineering	6	6	123
4	Chemical Engineering	3	3	84
5	Electrical Engineering	3	3	85

Shinsuke Sadamitsu

Publications

446

Citations

H-Index

Page 1

	Year	Citations
Dependence of the Grown-in Defect Distribution on Growth Rates in Czochralski Silicon Shinsuke Sadamitsu, Shigeru Umeno, Yasuo Koike, Japanese Journal of Applied Physics Growth RatesEngineeringCrystal Growth TechnologyFlow PatternsSilicon On Insulator	1993	135
Degradation of Gate Oxide Integrity by Metal Impurities Kazuo Hiramoto, Masakazu Sano, Shinsuke Sadamitsu, Japanese Journal of Applied Physics Electrical EngineeringChemical EngineeringGate OxidationEngineeringCorrosion	1989	44
Axial Microscopic Distribution of Grown-in Defects in Czochralski-Grown Silicon Crystals Shigeru Umeno, Shinsuke Sadamitsu, Hiroki Murakami, Japanese Journal of Applied Physics Materials ScienceAxial Microscopic DistributionOxygen ConcentrationEngineeringPhysics	1993	38
Growth Parameters Determining the Type of Grown-In Defects in Czockralski Silicon Crystals Masataka Hourai, Eiji Kajita, Takuji Nagashima, Materials science forum Materials ScienceEngineeringPhysicsCrystal MaterialCrystal Growth Technology	1995	32
A Model for the Formation of Oxidation-Induced Stacking Faults in Czochralski Silicon Shinsuke Sadamitsu, Masahiko Okui, Koji Sueoka, Japanese Journal of Applied Physics EngineeringOsf GenerationOxidation-induced Stacking FaultsSilicon On InsulatorDefect Tolerance	1995	25
Internal Gettering for Ni Contamination in Czochralski Silicon Wafers Koji Sueoka, Shinsuke Sadamitsu, Yasuo Koike, Journal of The Electrochemical Society Materials EngineeringMaterials ScienceChemical EngineeringEngineeringCrystalline Defects	2000	23
Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface Shinsuke Sadamitsu, Ayako Sasaki, Masataka Hourai, Japanese Journal of Applied Physics Materials ScienceFe ContaminationSio 4Surface CharacterizationEngineering	1991	23
Analysis of Local Lattice Strains Around Plate-Like Oxygen Precipitates in Czochralski-Silicon Wafers by Convergent-Beam Electron Diffraction Tetsuya Okuyama, Masaru Nakayama, Shinsuke Sadamitsu, Japanese Journal of Applied Physics Materials ScienceMaterials EngineeringPlate-like Oxygen PrecipitatesEngineeringDislocation Interaction	1997	22
TEM Observation of Defects Induced by Cu Contamination on Si(100) Surface Shinsuke Sadamitsu, Shigeo Sumita, Nobukatsu Fujino, Japanese Journal of Applied Physics Materials ScienceCu ContaminationEngineeringCrystalline DefectsCorrosion	1988	21
Gettering Characteristics of Heavy Metal Impurities in Silicon Wafers with Polysilicon Back Seal and Internal Gettering Satoshi Ogushi, Shinsuke Sadamitsu, Kieran Marsden, Japanese Journal of Applied Physics EngineeringSilicon On InsulatorPolysilicon Back SealGettering EfficiencyWafer Scale Processing	1997	21

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