Concepedia
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Publications
2
Citations
61
H-Index
Active since
2007
Affiliations
KU Leuven(Current)
IMEC
Ph. J. Roussel is an author at KU Leuven specializing in semiconductor reliability, device characterization, and semiconductor devices.
Publications per year
2007–2015
Origins and implications of increased channel hot carrier variability in nFinFETs
B. Kaczer, J. Franco, M. Cho et al. · 2015 · 39 citations · Full text
Engineering, Electrical Engineering, Materials Science +17
TDDB Reliability Prediction Based on the Statistical Analysis of Hard Breakdown Including Multiple Soft Breakdown and Wear-out
S. Sahhaf, R. Degraeve, Ph. J. Roussel et al. · 2007 · 22 citations
Engineering, Electrical Engineering, Microelectronics +14
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