Tomohisa Kitano

Infrared studies of transition layers at SiO2/Si interface

Haruhiko Ono, Taeko Ikarashi, K. Ando et al. · Journal of Applied Physics · 1998 · 52 citations

Natural Sciences, Materials Engineering, Materials Science +17

Bonding configurations of nitrogen absorption peak at 960 cm−1 in silicon oxynitride films

Haruhiko Ono, Taeko Ikarashi, Yoshinao Miura et al. · Applied Physics Letters · 1999 · 51 citations

Natural Sciences, Materials Science, Physics +11

High precision goniometer system for topography and diffractometry using multiple crystal arrangement

Tetsuya Ishikawa, Junji Matsui, Tomohisa Kitano · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1986 · 45 citations

Engineering, Geology, Metrology +9

Lattice spacing measurements around dislocations in an undoped GaAs crystal grown by the liquid-encapsulated Czochralski method

Tomohisa Kitano, Tetsuya Ishikawa, Junji Matsui · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1991 · 39 citations

Natural Sciences, Materials Science, Condensed Matter Physics +16

Annealing Properties of Defects in B⁺- and F⁺-Implanted Si Studied Using Monoenergetic Positron Beams

Akira Uedono, Tomohisa Kitano, K. Hamada et al. · Japanese Journal of Applied Physics · 1997 · 32 citations

Engineering, Materials Engineering, Materials Science +17