Jean-Philippe Colonna

Explanation of the Charge-Trapping Properties of Silicon Nitride Storage Layers for NVM Devices Part I: Experimental Evidences From Physical and Electrical Characterizations

Elisa Vianello, F. Driussi, L. Perniola et al. · IEEE Transactions on Electron Devices · 2011 · 35 citations · Full text

Non-volatile Memory, Engineering, Charge-trapping Properties +18

Limit to the erbium ions emission in silicon-rich oxide films by erbium ion clustering

N. Prtljaga, Daniel Navarro‐Urrios, A. Tengattini et al. · Optical Materials Express · 2012 · 27 citations · Full text

Optical Materials, Engineering, Luminescent Glass +19

Investigation of hafnium-aluminate alloys in view of integration as interpoly dielectrics of future Flash memories

G. Molas, M. Bocquet, Julien Buckley et al. · Solid-State Electronics · 2007 · 22 citations

Materials Engineering, Materials Science, Electrical Engineering +10

Thermal performance of 3D ICs: Analysis and alternatives

Cristiano Santos, Pascal Vivet, Jean-Philippe Colonna et al. · 2014 · 21 citations

Engineering, Energy Efficiency, Computer Architecture +18

Growth and Thermal Stability of SiGe/Si Superlattices on Bulk Si Wafers

Jean‐Michel Hartmann, Anne‐Marie Papon, Jean-Philippe Colonna et al. · ECS Transactions · 2008 · 21 citations

Materials Engineering, Materials Science, Wafer Scale Processing +15