Huang-Chun Wen

Decoupling the Fermi-level pinning effect and intrinsic limitations on p-type effective work function metal electrodes

Huang-Chun Wen, Prashant Majhi, Kisik Choi et al. · Microelectronic Engineering · 2007 · 52 citations

Materials Science, Electrical Engineering, Engineering +10

Origin of the Flatband-Voltage Roll-Off Phenomenon in Metal/High- $k$ Gate Stacks

G. Bersuker, Chang Seo Park, Huang-Chun Wen et al. · IEEE Transactions on Electron Devices · 2010 · 42 citations

Gate Stacks, Flatband-voltage Roll-off Phenomenon, Electrical Engineering +13

Comparison of effective work function extraction methods using capacitance and current measurement techniques

Huang-Chun Wen, Rino Choi, George Brown et al. · IEEE Electron Device Letters · 2006 · 39 citations

Electrical Engineering, Engineering, Current Measurement Techniques +11

On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-$k$ Dielectrics

Huang-Chun Wen, H. R. Harris, Chadwin D. Young et al. · IEEE Electron Device Letters · 2006 · 34 citations

Electrical Engineering, Dielectrics, Engineering +15

SPICE macromodel of silicon-on-insulator-field-effect-transistor-based biological sensors

Poornika G. Fernandes, H. Stiegler, Mingyue Zhao et al. · Sensors and Actuators B Chemical · 2011 · 32 citations

Electrical Engineering, Biomedical Sensors, Medical Electronics +6