D.L. Edgar

Comparison Of Pec And Sfec Nde Techniques

Maxim Morozov, Guiyou Tian, D.L. Edgar · Nondestructive Testing And Evaluation · 2008 · 37 citations

Optical Eddy Current, Electrical Engineering, Engineering +10

Fabrication of 30 nm T gates using SiNx as a supporting and definition layer

Y. Chen, D.L. Edgar, X. Li et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2000 · 17 citations

Engineering, Vlsi Design, Electron-beam Lithography +18

Coplanar waveguide transmission lines and highQ inductors on CMOS grade silicon using photoresist and polyimide

G. Ternent, Susan M. Ferguson, Z. Borsosfoldi et al. · Electronics Letters · 1999 · 14 citations

An ultrasonic solution for second-layer crack detection

Robert A. Smith, D.L. Edgar, L D Jones et al. · Insight - Non-Destructive Testing and Condition Monitoring · 2005 · 12 citations

Aeroacoustics, Engineering, Nondestructive Testing +14

Metamorphic GaAs HEMTs with f _T of 200 GHz

D.L. Edgar, N.I. Cameron, H. McLelland et al. · Electronics Letters · 1999 · 12 citations