H.M. Liaw

The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements

H.M. Liaw, F.S. Hickernell · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 1995 · 58 citations

Aluminium Nitride, Aeroacoustics, Saw Transducers +19

Electrical characteristics of Si3N4/Si/GaAs metal-insulator-semiconductor capacitor

David Mui, H.M. Liaw, A. L. Demirel et al. · Applied Physics Letters · 1991 · 51 citations

Semiconductors, Electrical Characteristics, Electrical Engineering +12

A self-aligned elevated source/drain MOSFET

J.R. Pfiester, R.D. Sivan, H.M. Liaw et al. · IEEE Electron Device Letters · 1990 · 46 citations

Electrical Engineering, Engineering, Electronic Engineering +9

Comparative study of the elastic properties of polycrystalline aluminum nitride films on silicon by Brillouin light scattering

G. Carlotti, G. Gubbiotti, F.S. Hickernell et al. · Thin Solid Films · 1997 · 45 citations

Materials Science, Aluminium Nitride, Engineering +9

GaN epilayers grown on 100 mm diameter Si(111) substrates

H.M. Liaw, R. Venugopal, Jiangbin Wan et al. · Solid-State Electronics · 2000 · 33 citations

Electrical Engineering, Engineering, Gan Epilayers +3